The SECM150 is fully controlled by software designed to improve the user experience. All of the experimental options of the SECM150 can be set up and controlled using its proprietary software. Throughout each experiment, data is displayed, as it is collected, to allow users to follow the progression of their experiments. Data is displayed in multiple views, and users can even produce their own templates to present exactly the information needed. A number of options are available to export experimental results which include the relevant experimental information needed for use with third-party software.
The SECM150 is fully controlled by software which has been designed with user experience in mind. All of the experimental options of the SECM150 can be set up and controlled using its proprietary software. Throughout each experiment, data is displayed as it is collected to allow users to follow the progression of their experiments. Data is displayed in multiple views, and users can even produce their own templates to present exactly the information needed. A number of options are available to export experimental results which include the relevant experimental information needed for use with third-party software.

Seven discrete experiments provided throughout, each with their own individual variations such as:

• Step Scan
• Pre-Delays, Line-Delays, Velocities, Step Sizes, Scan Dimensions, Signal Conditioning Parameters, Control Loop Parameters, Potentiostat Setting, etc.

The Software provides 64bit WindowsTM support in a standard Multiple Document Interface (MDI) application that supports all standard WindowsTM features.
The Software is completely self-contained in a single application and contains:

SECM150
• Electrochemistry suite	(EChem)
• Scanning Electrochemical Microscopy	(SECM)

Standard features

• Experiment Sequencing.
• Multiple views of the same data presented in different formats or presentations.
• User-definable presentations of the data through a simple template-design tool.
• Direct real-time readout of displacement in x, y and z.
• Simultaneous acquisition of multiple parameters at each point; 1 scan = many maps.
• Application preferences for current convention.
• Application preferences for graph visuals.

Analysis
2D & 3D analysis tools