M470 Scanning Electrochemical Workstation Software
The Scanning Electrochemical Workstation software provides unique capabilities and interactivity in support of the Model 470 nanometer-resolution scanning probe microscope. This highly ergonomic software has been designed to facilitate and improve the user experience and to improve the efficiency of workflows:
- Improved data analysis, manipulation and interactivity
- Automatic measurement and sequencing functionalities.
Over 40 discrete experiments provided throughout, each with their own individual variations such as:
- Height-Tracking (above surface)
- Surface-Tracking (on surface)
- Step Scan
- Sweep Scan
- Pre-Delays, Line-Delays, Velocities, Step Sizes, Scan Dimensions, Signal Conditioning Parameters, Control Loop Parameters, Potentiostat Setting etc.
The Software provides both 64 bit WindowsTM support in a standard Multiple Document Interface (MDI) application that supports all standard WindowsTM features.
The Software is completely self-contained in a single application and contains:
| Overview | |
| • Electrochemistry suite | (EChem) |
| • Corrosion suite | (ECorr) |
| • Scanning Electrochemical Microscopy | (SECM) |
| • alternating-current Scanning Electrochemical Microscopy | (ac-SECM) |
| • intermittent-contact Scanning Electrochemical Microscopy | (ic-SECM) |
| • combined ic-ac Scanning Electrochemical Microscopy | (ic-ac-SECM) |
| • Scanning Vibrating Electrode | (SVET) |
| • Scanning Kelvin Probe | (ac-SECM) |
| • Capacitive Height Measurement/Tracking | (SKP) |
| • Localized Electrochemical Impedance Spectroscopy | (LEIS) |
| • Scanning Droplet System / Cell | (SDS / SDC) |
| • alternating-current Scanning Droplet System/ Cell | (ac-SDS / ac-SDC) |
| • Non-contact Optical Surface Profiling (Laser based) | (OSP) |
- Experiment Sequencing.
- Multiple views of the same data presented in different formats or presentations.
- User-definable presentations of the data through a simple template-design tool.
- Fully programmable macro language for non-standard experiments.
- Relieve sample topography in area maps using “Height Tracking” from any topography data source: CHM, CTM, OSP, and ic-SECM.
- Direct real-time readout of displacement in x, y and z.
- Surface maps acquired at up to 70,000 data points in each axis.
- Simultaneous acquisition of multiple parameters at each point; 1 scan = many maps.
- Up to 12 different area maps populated simultaneously in a single scan, with 4 additional maps reserved for users’ data analysis.
- Application preferences for current convention.
- Application preferences for graph visuals.
Analysis
2D & 3D analysis tools
